Overview
Beitian USB to TTL level Conversion Cable (USB to TTL debugging adapter cable) based on the PL-2303HX/TA chip, designed for USB-to-TTL serial debugging and conversion tasks on Windows XP/WIN7/8 systems. It uses a USB interface on the host side and provides a TTL connector on the device side, with multiple interface configurations available.
Key Features
- Marked compatibility: Windows XP/WIN7/8; PL-2303HX/TA chip.
- USB to TTL debugging adapter cable design for serial conversion/debugging use.
- Multi-specification interface configuration to meet different usage requirements.
- Labeled “USB Interface” and “Three-view drawing” product display.
- Labeled build/quality notes: “Meticulous Craftsmanship”, “Focus only on quality”, “3 times Quality Inspection”, “55 dishes Craftsmanship”, “18 times Mold Adjustment”.
- Labeled cable-core note: “Brand new experience, thickened all-copper core”.
- Labeled performance statements: “High-speed transmission, fast charging, feature integration (meeting multiple scenario needs)”, “40%! REAL ACCELERATION”.
Specifications
| Brand | Beitian |
| Product Type | USB to TTL level Conversion Cable (USB to TTL debugging adapter cable) |
| Chip | PL-2303HX/TA |
| Supported OS (as labeled) | Windows XP / WIN7 / 8 |
| Host Interface | USB |
| TTL Connector Options (Shopify variants) | 4 PIN TTL-USB WITH LOCK; 6 PIN TTL-USB WITH LOCK; 8 PIN TTL-USB WITH LOCK |
| Additional marking | “6PIN-USB” (shown) |
Applications
- USB-to-TTL serial conversion for debugging and configuration of TTL/UART devices.
- General USB debugging adapter cable use where a lock-style multi-pin TTL plug is required.
For pre-sales questions about choosing the correct 4/6/8-pin lock variant, contact support@rcdrone.top.
Details

Built on the PL-2303HX/TA chipset, this USB-to-TTL adapter cable supports labeled Windows XP/7/8 systems for serial debugging and conversion tasks.

Multiple lock-style TTL connector options help match different UART/TTL wiring needs, while the molded USB plug keeps the connection secure.

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